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6" Fab For Sale from Moov - Click Here to Learn More
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JEOL JSM 6400
    説明
    The gun alignment control electronics are currently in need of repair.
    構成
    Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    JEOL

    JSM 6400

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    63760


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEM
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    JEOL

    JSM 6400

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/07f51024b4b04ccc95736e650ec6b100_64001_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/eab644fc8573453d9d76f24994941e9e_angledviewstage_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/dc07eb14a13240c5bea4810f426df399_owenscamera2006_mw.jpeg
    listing-photo-803a53db748f415bb564d8df6374124b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51225/803a53db748f415bb564d8df6374124b/aa6eb98c6fe948f28acbb204ee725d5f_sempartofcrt_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    63760


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    The gun alignment control electronics are currently in need of repair.
    構成
    Ultra thin window energy dispersive XPS Three WDS spectrometers Geller dSspec automation system controlling spectrometers Motorized Stage Imaging modes include secondary electrons, backscattered electrons and x-rays. Under ideal conditions, resolution in secondary electron imaging mode is 5 nm. Images can be recorded with Polaroid film and/or digital image capture through the Geller dPict module with subsequent output to a 1200 dpi laser printer. Characteristic x-rays can be detected from as little as a 1 cubic micrometer volume of the specimen. Elements from atomic number 5 (B) to 92 (U) can be detected in concentrations above 0.001 wt% element. Analysis modes include qualitative, standardless, and fully rigorous standards-based quantitative analysis. Additional capabilities of the Geller software package include analog and digital x-ray mapping and report generation. Both analog and digital x-ray or compositional mapping are available.
    OEMモデルの説明
    提供なし
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前
    JEOL JSM 6400

    JEOL

    JSM 6400

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前