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JEOL JSM-6490LV
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    ドキュメント

    ドキュメントなし

    JEOL

    JSM-6490LV

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    63964


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEM
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    JEOL

    JSM-6490LV

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 60日以上前
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/848dd5f90dc746d497f7b65164615079_img2481_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/84cd808aaf4b4f7189833c6a76a2c2f9_img2483_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/304314a4dc32416eb4833ff6a308439f_img2484_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/04be449eef16463fb77d90d3f91c80db_img2486_mw.jpg
    listing-photo-712dd8cfeb5a4015bacd1f6e08a51f04-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1213/712dd8cfeb5a4015bacd1f6e08a51f04/fee8ebdec60f4f2a92f5fdcef9cc3db4_img2487_mw.jpg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    63964


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    Presenting the JEOL 6490LV SEM featuring W-filament technology. Equipped with SE, BSE, and EDS detectors, it operates in high- or low-vacuum modes, enabling sub-micron-scale imaging and X-ray compositional data collection without sample coating. The EDS detector allows qualitative and semi-quantitative elemental analysis of sub-micron volumes, X-ray mapping over mm-scale fields of view, and X-ray line scans. Achieve comprehensive characterization effortlessly with the JEOL 6490LV SEM.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前
    JEOL JSM-6490LV

    JEOL

    JSM-6490LV

    SEMヴィンテージ: 0状態: 中古最終検証:60日以上前