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JEOL JSM-6510LV
    説明
    SEM
    構成
    JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)
    OEMモデルの説明
    Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.
    ドキュメント

    ドキュメントなし

    JEOL

    JSM-6510LV

    verified-listing-icon

    検証済み

    カテゴリ
    SEM

    最終検証: 8日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    116074


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2014


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    JEOL JSM-6510LV

    JEOL

    JSM-6510LV

    SEM
    ヴィンテージ: 2014状態: 中古
    最終確認8日前

    JEOL

    JSM-6510LV

    verified-listing-icon
    検証済み
    カテゴリ
    SEM
    最終検証: 8日前
    listing-photo-3982552681fb49e9ad9083607c57de31-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    116074


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2014


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    SEM
    構成
    JSM-6510LV EDS AMETEK EDAX Octane Pro Operation Keyboard Motor Controlled Stage(2 Axis)
    OEMモデルの説明
    Introducing the JSM-6510LV Low Vacuum SEM: a high-performance, cost-effective scanning electron microscope. Ideal for fast characterization and imaging of fine structures, it belongs to a widely-used SEM family applicable in diverse research and industrial fields. Its selectable Low Vacuum mode enables observation of specimens with excessive water content or non-conductive surfaces. With a remarkable resolution of 3.0nm at 30kV, it offers exceptional clarity for precise measurements and 3D analysis. The SEM features dual live image display to contrast and compare specific details. Enhance your research further with optional elemental analysis using the energy dispersive X-ray spectrometer (EDS). Discover unparalleled imaging resolution, versatility, and ease of use with JSM-6510LV.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    JEOL JSM-6510LV

    JEOL

    JSM-6510LV

    SEMヴィンテージ: 2014状態: 中古最終検証:8日前
    JEOL JSM-6510LV

    JEOL

    JSM-6510LV

    SEMヴィンテージ: 2009状態: 中古最終検証:30日以上前