説明
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer構成
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEMモデルの説明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.ドキュメント
ドキュメントなし
KRATOS ANALYTICAL
AXIS ULTRA
検証済み
カテゴリ
Spectrometer / SIMS
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
63898
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KRATOS ANALYTICAL
AXIS ULTRA
カテゴリ
Spectrometer / SIMS
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
63898
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Monochromated Al + non-mono dual-source Al+Mg SAC 1.5x10to-9 Torr achievable and STC 10to-8 Torr Charge Neutralizer構成
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEMモデルの説明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.ドキュメント
ドキュメントなし