説明
説明なし構成
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEMモデルの説明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.ドキュメント
ドキュメントなし
KRATOS ANALYTICAL
AXIS ULTRA
検証済み
カテゴリ
Spectrometer
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
63898
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KRATOS ANALYTICAL
AXIS ULTRA
カテゴリ
Spectrometer
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
63898
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
Mono Al Ka (1486.6eV) -Sample sizes up to 2cm in diameter and up to 10mm thick -Load lock for fast sample interchange -Precision auto stage for multiple unattended sample analysis -Depth Profiling for multilayered thin film analysis -Variable angle sample orientation- angular dependent XPS -Sample heating (600C) and sample cooling (-150C) -Elemental imaging (min 200 µm x 200 µm) on selected samples -Small spot analysis (min 27µm) on selected samplesOEMモデルの説明
Step into the future of imaging and small spot XPS with AXIS ULTRA, a trailblazing market leader that now boasts cutting-edge photoelectron detector technology. Experience a revolutionary blend of quantitative, real-time parallel imaging, and unparalleled high-resolution spectroscopy across all analysis areas. This next-generation system elevates the boundaries of possibility, offering an exceptional platform for your advanced research needs.ドキュメント
ドキュメントなし