説明
説明なし構成
構成なしOEMモデルの説明
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.ドキュメント
ドキュメントなし
JEOL
JEM-3010
検証済み
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
69539
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JEM-3010
カテゴリ
TEM
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
69539
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The JEM-3010 is an ultrahigh resolution analytical electron microscope that boasts a point resolution of 0.17nm. It’s a versatile tool in materials science and innovation, with the HT Version offering a specimen tilt of ±45°. Notable features include a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bakeout function for maintaining clean specimen environments, and computer-controlled data management and storage.ドキュメント
ドキュメントなし