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説明
With ASC2000 controller構成
構成なしOEMモデルの説明
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.ドキュメント
ドキュメントなし
PREFERRED
SELLER
カテゴリ
Thin Film / Film Thickness
最終検証： 20日前
Buyer pays 12% premium of final sale price
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
124770
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
PREFERRED
SELLER
KLA / ADE
ULTRAGAGE 9500
カテゴリ
Thin Film / Film Thickness
最終検証： 20日前
Buyer pays 12% premium of final sale price
主なアイテムの詳細
状態：
Refurbished
稼働ステータス:
不明
製品ID：
124770
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
With ASC2000 controller構成
構成なしOEMモデルの説明
The ADE 9500 UltraGage is a benchmark in wafer geometry characterization, essential in device fabrication and silicon wafer manufacturing. It accurately measures thickness, flatness, bow/warp, and more, using noncontact methods with 10nm resolution, applicable to both patterned and polished wafers. This compact tool offers nondestructive control, with options for manual or cassette operation, and supports optional networking including SECS/GEM. Ideal for applications in photolithography, CMP, and other processes, the UltraGage is a versatile, high-performance metrology solution.ドキュメント
ドキュメントなし