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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 4150
    説明
    Nanometrics Nanospec 4150 Film Thickness Measure
    構成
    Automatic Stage & Stage controller with twin chuck (4 ~ 8" wafer size) UV lamp housing & Deuterium Lamp Power Supply Auto focus : Not available (Image capture board to be repaired) Wavelength : Visible 400~900nm , 200~900nm with UV (option) Accuracy : Within ± 1% (Oxide Standard) Precision : 2Å, 500~50,000Å Visible /1Å, 25~500Å UV option Stability : 0.5% or 5Å or whichever is greater Data analysis : Mapping contour 2D and 3D / Statistical Process Control (SPC)
    OEMモデルの説明
    The Model 4150, an enhanced version of the Model 4100 introduced in the middle of 1994, provides automated stage and focusing systems for hands-off uniformity maps.
    ドキュメント

    ドキュメントなし

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 4150

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    17226


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    1998


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 4150

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 4150

    Thin Film / Film Thickness
    ヴィンテージ: 1998状態: 中古
    最終確認60日以上前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 4150

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 60日以上前
    listing-photo-hIBzBGZ20gxBJ8HcFHmYTvOwqnz5FVPCrGh4IWUTvag-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/hIBzBGZ20gxBJ8HcFHmYTvOwqnz5FVPCrGh4IWUTvag/cae3a356b28241bbb8bd1aea11a96a2b_1_mw.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    17226


    ウェーハサイズ:

    8"/200mm


    ヴィンテージ:

    1998


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Nanometrics Nanospec 4150 Film Thickness Measure
    構成
    Automatic Stage & Stage controller with twin chuck (4 ~ 8" wafer size) UV lamp housing & Deuterium Lamp Power Supply Auto focus : Not available (Image capture board to be repaired) Wavelength : Visible 400~900nm , 200~900nm with UV (option) Accuracy : Within ± 1% (Oxide Standard) Precision : 2Å, 500~50,000Å Visible /1Å, 25~500Å UV option Stability : 0.5% or 5Å or whichever is greater Data analysis : Mapping contour 2D and 3D / Statistical Process Control (SPC)
    OEMモデルの説明
    The Model 4150, an enhanced version of the Model 4100 introduced in the middle of 1994, provides automated stage and focusing systems for hands-off uniformity maps.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 4150

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 4150

    Thin Film / Film Thicknessヴィンテージ: 1998状態: 中古最終検証:60日以上前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 4150

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 4150

    Thin Film / Film Thicknessヴィンテージ: 0状態: 中古最終検証:昨日