説明
Ox film thickness measurement構成
Ellipsometer is includedOEMモデルの説明
The NanoSpec 8000XSE is a stand-alone, automated thin film measurement system that can handle wafers ranging in size from 75 to 200 millimeters in diameter. It includes a fully integrated spectroscopic ellipsometer for ultrathin and multiple film stack measurement applications. An FTIR option can be added to measure the thickness of epi-silicon. The 8000XSE also offers a standard mechanical interface with mini-environment enclosures for use in ultra-clean manufacturing facilities and can be configured to handle substrates used in the magnetic recording head industry.ドキュメント
ドキュメントなし
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8000XSE
検証済み
カテゴリ
Thin Film / Film Thickness
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
74807
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8000XSE
カテゴリ
Thin Film / Film Thickness
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
74807
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Ox film thickness measurement構成
Ellipsometer is includedOEMモデルの説明
The NanoSpec 8000XSE is a stand-alone, automated thin film measurement system that can handle wafers ranging in size from 75 to 200 millimeters in diameter. It includes a fully integrated spectroscopic ellipsometer for ultrathin and multiple film stack measurement applications. An FTIR option can be added to measure the thickness of epi-silicon. The 8000XSE also offers a standard mechanical interface with mini-environment enclosures for use in ultra-clean manufacturing facilities and can be configured to handle substrates used in the magnetic recording head industry.ドキュメント
ドキュメントなし