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ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NanoSpec 8300X is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It was first introduced in July 1996 at the SEMICON/West trade show and is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today. The development of the NanoSpec 8300X was part of a project launched by SEMATECH, a consortium of large U.S. semiconductor manufacturers, to develop tools for the eventual industry shift to the manufacture of ICs on 300mm semiconductor wafers, which are designed to allow lower production cost due to the ability to simultaneously manufacture many more chips per wafer.
    ドキュメント

    ドキュメントなし

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Parts Tool


    稼働ステータス:

    不明


    製品ID:

    114479


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    Thin Film / Film Thickness
    ヴィンテージ: 0状態: 部品ツール
    最終確認30日以上前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 30日以上前
    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/d434c2a2bcd241668db37a889497b396_82613d6b2013440086d2af47e4ef3d15_mw.jpeg
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    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/eb853999b47d4709a9ecd34f8ac08ee4_258e609015ba4b548c6bdc29b2e1836b_mw.jpeg
    listing-photo-b4305681a53e48de82f769ba3791c70b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/b4305681a53e48de82f769ba3791c70b/dbbb0f8f721e4f89839fbcb233efad0b_64a0a0edd9154aba9b5d752776df0ae4_mw.jpeg
    主なアイテムの詳細

    状態:

    Parts Tool


    稼働ステータス:

    不明


    製品ID:

    114479


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The NanoSpec 8300X is a film thickness measuring system designed by Nanometrics for the semiconductor industry. It was first introduced in July 1996 at the SEMICON/West trade show and is capable of handling both 200mm and 300mm diameter wafers. The system incorporates both a spectroscopic ellipsometer and spectrophotometer, enabling it to accurately measure and analyze virtually any dielectric film used in semiconductor manufacture today. The development of the NanoSpec 8300X was part of a project launched by SEMATECH, a consortium of large U.S. semiconductor manufacturers, to develop tools for the eventual industry shift to the manufacture of ICs on 300mm semiconductor wafers, which are designed to allow lower production cost due to the ability to simultaneously manufacture many more chips per wafer.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    ONTO / NANOMETRICS / ACCENT / BIO-RAD NANOSPEC 8300X

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    NANOSPEC 8300X

    Thin Film / Film Thicknessヴィンテージ: 0状態: 部品ツール最終検証:30日以上前