説明

Filmetrics F50-UV Automated Thin-Film Thickness Mapping System — Complete Verified Package This is a complete, fully tested thin-film metrology system including the F50-UV mapper and LS-DT2 Deuterium-Tungsten-Halogen light source — the exact factory configuration for UV-range measurements (200–1100 nm). ✔ VERIFIED WORKING — Raw signal spectrum confirmed across full 200–1100 nm UV range. System S/N 14L093 recognized by FILMapper software. See photos. Main Unit — Filmetrics F50-UV Thin-Film Mapper Model: 205-0629 | S/N: 14L093 | Year: 2014 System identified in software as: F50-300 Rev. B-UV Automated R-Theta motorized mapping stage Built-in spectrometer, High Speed USB2.0 FILMapper Version 7.20.6 confirmed Powers on, stage initializes, USB communication verified Light Source — Filmetrics LS-DT2 Model: 205-0576 | S/N: 14B072 Deuterium (UV) + Tungsten-Halogen (VIS/NIR) Full spectrum output 200–1100 nm confirmed Powers on, all indicators functional Included: SiO₂/Si Test Wafer — 7127.4 Å, S/N 14L093 (matched to instrument) Si Reference Wafers — 3 sizes BK7 Reflectance Standard Fiber optic probe — P/N 605-0516D-5095 Wafer chuck alignment rings — multiple sizes USB cable, power cables FILMapper software disc included Software: FILMapper v7.20.6 software disc included. Also available free directly from KLA/Filmetrics by serial number for institutional buyers.