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KLA / THERMA-WAVE OP-7341
    説明
    CD OPTICAL MEASUREMENT, CU
    構成
    構成なし
    OEMモデルの説明
    The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.
    ドキュメント

    ドキュメントなし

    KLA / THERMA-WAVE

    OP-7341

    verified-listing-icon

    検証済み

    カテゴリ
    Thin Film / Film Thickness

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    92886


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA / THERMA-WAVE OP-7341

    KLA / THERMA-WAVE

    OP-7341

    Thin Film / Film Thickness
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    KLA / THERMA-WAVE

    OP-7341

    verified-listing-icon
    検証済み
    カテゴリ
    Thin Film / Film Thickness
    最終検証: 30日以上前
    listing-photo-f5111f174f564d7a91ab6fc90788a824-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    92886


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    CD OPTICAL MEASUREMENT, CU
    構成
    構成なし
    OEMモデルの説明
    The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA / THERMA-WAVE OP-7341

    KLA / THERMA-WAVE

    OP-7341

    Thin Film / Film Thicknessヴィンテージ: 0状態: 中古最終検証:30日以上前