説明
CD OPTICAL MEASUREMENT, CU構成
構成なしOEMモデルの説明
The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.ドキュメント
ドキュメントなし
KLA / THERMA-WAVE
OP-7341
検証済み
カテゴリ
Thin Film / Film Thickness
最終検証： 21日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
92886
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / THERMA-WAVE
OP-7341
カテゴリ
Thin Film / Film Thickness
最終検証： 21日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
92886
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
CD OPTICAL MEASUREMENT, CU構成
構成なしOEMモデルの説明
The Opti-Probe 7341 is a thin-film and critical dimension (CD) metrology tool that is part of Therma-Wave’s Opti-Probe line of thin-film measurement tools. It delivers a metrology solution for high-volume 65nm chip production to semiconductor manufacturers, yielding better precision and productivity than earlier generation tools. Comprehensive field data for the Opti-Probe-7341 demonstrates an improvement in performance for its customers’ most critical thin-film and optical CD applications by a factor of up to two times.ドキュメント
ドキュメントなし