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KLA UV-1280SE
  • KLA UV-1280SE
  • KLA UV-1280SE
  • KLA UV-1280SE
説明
説明なし
構成
構成なし
OEMモデルの説明
The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
ドキュメント

ドキュメントなし

PREFERRED
 
SELLER
verified-listing-icon

検証済み

カテゴリ
Thin Film / Film Thickness

最終検証: 30日以上前

Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

125563


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

UV-1280SE

verified-listing-icon
検証済み
カテゴリ
Thin Film / Film Thickness
最終検証: 30日以上前
listing-photo-9817813a19e74db8aa8b8a8655dceb28-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Buyer pays 12% premium of final sale price
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

125563


ウェーハサイズ:

不明


ヴィンテージ:

不明


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし
構成
構成なし
OEMモデルの説明
The Prometrix UV-1280SE is a production thin film measurement system that combines dual-beam spectrophotometry and broadband spectroscopic ellipsometry. It can directly measure film thickness, refractive index, and extinction coefficient of single- and multi-layer thin film stacks simultaneously. The system is easy to use, lowers cost of ownership, and increases production efficiency. It is useful for both process control and advanced materials development.
ドキュメント

ドキュメントなし