説明
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.構成
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEMモデルの説明
提供なしドキュメント
ドキュメントなし
N & K
3700 RT
検証済み
カテゴリ
Thin Film / Film Thickness
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
12889
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
N & K
3700 RT
カテゴリ
Thin Film / Film Thickness
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
12889
ウェーハサイズ：
8"/200mm
ヴィンテージ：
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.構成
Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.OEMモデルの説明
提供なしドキュメント
ドキュメントなし