3300
概要（Overview）
An advanced automated optical metrology system from n&k Technology designed for non-destructive characterization and monitoring of thin film materials and semiconductor wafers
現在の掲載品
0
サービス
検査、保証、鑑定、ロジスティクス
Messages
Messages
Messages including contact info may not be shared. We scan, review, and reserve the right to remove sensitive information from all messages to prevent fraud and policy violations.All messages subject to review, review our policy for more info.
