説明
Surface Charge Analyzer構成
構成なしOEMモデルの説明
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductorsドキュメント
ドキュメントなし
SEMITOOL
CnCV 230
カテゴリ
Thin Film / Film Thickness
最終検証： 22日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142961
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Surface Charge Analyzer構成
構成なしOEMモデルの説明
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductorsドキュメント
ドキュメントなし