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LAM RESEARCH / SEZ DV-PRIME
    説明
    Single Wafer Processing
    構成
    構成なし
    OEMモデルの説明
    The Da Vinci Prime (DVP) is an advanced single-wafer wet processing platform that combines SEZ’s proven Da Vinci technology with its newest capabilities. It is designed to address the increasing overlap of BEOL and FEOL applications and the emergence of new materials. The DVP features double-sided processing, non-damage defect removal, minimized watermark formation, and multi-chemical recirculation capabilities. It targets a mix of BEOL and FEOL applications and offers key benefits such as maximized throughput, enhanced surface defect removal, and reduced media consumption.
    ドキュメント

    ドキュメントなし

    verified-listing-icon

    検証済み

    カテゴリ
    Wet Etch

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    135563


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    LAM RESEARCH / SEZ DV-PRIME

    LAM RESEARCH / SEZ

    DV-PRIME

    Wet Etch
    ヴィンテージ: 2007状態: 中古
    最終確認60日以上前

    LAM RESEARCH / SEZ

    DV-PRIME

    verified-listing-icon
    検証済み
    カテゴリ
    Wet Etch
    最終検証: 30日以上前
    listing-photo-92bcdb8ed4c8427a950c11bf9eb9247d-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    135563


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Single Wafer Processing
    構成
    構成なし
    OEMモデルの説明
    The Da Vinci Prime (DVP) is an advanced single-wafer wet processing platform that combines SEZ’s proven Da Vinci technology with its newest capabilities. It is designed to address the increasing overlap of BEOL and FEOL applications and the emergence of new materials. The DVP features double-sided processing, non-damage defect removal, minimized watermark formation, and multi-chemical recirculation capabilities. It targets a mix of BEOL and FEOL applications and offers key benefits such as maximized throughput, enhanced surface defect removal, and reduced media consumption.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    LAM RESEARCH / SEZ DV-PRIME

    LAM RESEARCH / SEZ

    DV-PRIME

    Wet Etchヴィンテージ: 2007状態: 中古最終検証:60日以上前
    LAM RESEARCH / SEZ DV-PRIME

    LAM RESEARCH / SEZ

    DV-PRIME

    Wet Etchヴィンテージ: 0状態: 中古最終検証:30日以上前
    LAM RESEARCH / SEZ DV-PRIME

    LAM RESEARCH / SEZ

    DV-PRIME

    Wet Etchヴィンテージ: 0状態: 中古最終検証:60日以上前