説明
Analytical X-Ray B.V. Diffractometer System from Philips PW: 3040/60 X'Pert PRO 12Nc: 943003040601 DY: 1604 0213 220 V~, 8.5 KVA, 60 Hz構成
構成なしOEMモデルの説明
The PANalytical X'Pert PRO diffraction system is a highly adaptable and modular tool designed for various applications, from routine characterization to in-depth research investigations. Its PreFIX concept allows quick reconfiguration without realignment, eliminating downtime. The open design architecture ensures compatibility with future advancements. The latest X'Celerator RTMS detector significantly speeds up data collection, from hours to minutes, maintaining data quality and user-friendliness. A powerful and efficient solution for researchers in diverse fields.ドキュメント
ドキュメントなし
カテゴリ
X-Ray / XRD / XRF
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131942
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PANalytical
X'PERT PRO XRD
カテゴリ
X-Ray / XRD / XRF
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131942
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Analytical X-Ray B.V. Diffractometer System from Philips PW: 3040/60 X'Pert PRO 12Nc: 943003040601 DY: 1604 0213 220 V~, 8.5 KVA, 60 Hz構成
構成なしOEMモデルの説明
The PANalytical X'Pert PRO diffraction system is a highly adaptable and modular tool designed for various applications, from routine characterization to in-depth research investigations. Its PreFIX concept allows quick reconfiguration without realignment, eliminating downtime. The open design architecture ensures compatibility with future advancements. The latest X'Celerator RTMS detector significantly speeds up data collection, from hours to minutes, maintaining data quality and user-friendliness. A powerful and efficient solution for researchers in diverse fields.ドキュメント
ドキュメントなし