We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 続きを読む
説明
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 Loadport構成
Process- MetrologyOEMモデルの説明
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.ドキュメント
ドキュメントなし
カテゴリ
CD-SEM
最終検証： 30日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
110826
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
VeraSEM
カテゴリ
CD-SEM
最終検証： 30日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
110826
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 Loadport構成
Process- MetrologyOEMモデルの説明
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.ドキュメント
ドキュメントなし