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SEMVISION G3 LITE
概要（Overview）
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
現在の掲載品
7
サービス
検査、保証、鑑定、ロジスティクス
トップ掲載リスト
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect Inspectionヴィンテージ： 2007状態： 中古最終確認60日以上前APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect Inspectionヴィンテージ： 2007状態： 中古最終確認60日以上前APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect Inspectionヴィンテージ： 2007状態： 中古最終確認60日以上前APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect Inspectionヴィンテージ： 2007状態： 中古最終確認60日以上前
