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APPLIED MATERIALS (AMAT) SEMVISION G3 LITE
    説明
    Defect review sem
    構成
    構成なし
    OEMモデルの説明
    The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
    ドキュメント

    ドキュメントなし

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    113025


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2007


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    Defect Inspection
    ヴィンテージ: 2007状態: 中古
    最終確認60日以上前

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-037b6d1d91514518a35c771007a7daf3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    113025


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2007


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Defect review sem
    構成
    構成なし
    OEMモデルの説明
    The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    Defect Inspectionヴィンテージ: 2007状態: 中古最終検証:60日以上前
    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    Defect Inspectionヴィンテージ: 2007状態: 中古最終検証:60日以上前
    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    Defect Inspectionヴィンテージ: 2007状態: 中古最終検証:60日以上前