説明
Asset Description 461624.86 Software Version 5.3.10 CIM 10.93.22.120 Process Defect review sem構成
Hardware Configuration System Type Description Quantity Options System Main System SEMVision G3 LITE 1 Handler System TDK 1 Factory Interface FOUP 2 Others Electronic Rack 1 Description Quantity OM Controller 1OEMモデルの説明
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.ドキュメント
ドキュメントなし
カテゴリ
Defect Inspection
最終検証： 9日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
146738
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
カテゴリ
Defect Inspection
最終検証： 9日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
146738
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Asset Description 461624.86 Software Version 5.3.10 CIM 10.93.22.120 Process Defect review sem構成
Hardware Configuration System Type Description Quantity Options System Main System SEMVision G3 LITE 1 Handler System TDK 1 Factory Interface FOUP 2 Others Electronic Rack 1 Description Quantity OM Controller 1OEMモデルの説明
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.ドキュメント
ドキュメントなし