説明
説明なし構成
-Software Version: 5.3.10 -CIM: 10.93.22.120 -Process: Defect review sem -Main System SEMVision G3 LITE Qty 1 (OK) -Factory Interface FOUP Qty 2 (OK) -Others Electronic Rack Qty 1 (OK) Missing/Faulty Parts / Accessories List: -OM Controller Qty 1OEMモデルの説明
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.ドキュメント
ドキュメントなし
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
検証済み
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
104929
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
104929
ウェーハサイズ：
12"/300mm
ヴィンテージ：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
-Software Version: 5.3.10 -CIM: 10.93.22.120 -Process: Defect review sem -Main System SEMVision G3 LITE Qty 1 (OK) -Factory Interface FOUP Qty 2 (OK) -Others Electronic Rack Qty 1 (OK) Missing/Faulty Parts / Accessories List: -OM Controller Qty 1OEMモデルの説明
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.ドキュメント
ドキュメントなし