説明
説明なし構成
WF-736DUVOEMモデルの説明
Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.ドキュメント
ドキュメントなし
APPLIED MATERIALS (AMAT)
WF-736
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
72127
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2000
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示APPLIED MATERIALS (AMAT)
WF-736
カテゴリ
Defect Inspection
最終検証: 60日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
72127
ウェーハサイズ:
8"/200mm
ヴィンテージ:
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
WF-736DUVOEMモデルの説明
Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.ドキュメント
ドキュメントなし