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WI-2280
概要（Overview）
Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
現在の掲載品
3
サービス
検査、保証、鑑定、ロジスティクス
