説明
Particle Measurement構成
構成なしOEMモデルの説明
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.ドキュメント
ドキュメントなし
KLA
SURFSCAN 7700
検証済み
カテゴリ
Defect Inspection
最終検証: 16日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
71446
ウェーハサイズ:
8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示KLA
SURFSCAN 7700
カテゴリ
Defect Inspection
最終検証: 16日前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
71446
ウェーハサイズ:
8"/200mm
ヴィンテージ:
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Particle Measurement構成
構成なしOEMモデルの説明
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.ドキュメント
ドキュメントなし