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KLA 2139
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    ドキュメント

    ドキュメントなし

    KLA

    2139

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 30日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    114134


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA 2139

    KLA

    2139

    Defect Inspection
    ヴィンテージ: 2001状態: 中古
    最終確認60日以上前

    KLA

    2139

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 30日以上前
    listing-photo-ccca63ac361c4d6ab4bff9798138a801-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    114134


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA 2139

    KLA

    2139

    Defect Inspectionヴィンテージ: 2001状態: 中古最終検証:60日以上前
    KLA 2139

    KLA

    2139

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:30日以上前
    KLA 2139

    KLA

    2139

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前