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KLA 2351
    説明
    Bright field detection No missing parts Current size : 12
    構成
    構成なし
    OEMモデルの説明
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
    ドキュメント

    ドキュメントなし

    KLA

    2351

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Deinstalled


    製品ID:

    107147


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA 2351

    KLA

    2351

    Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    KLA

    2351

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-ab2de3c4577e45da994776f5b89a617a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    Deinstalled


    製品ID:

    107147


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Bright field detection No missing parts Current size : 12
    構成
    構成なし
    OEMモデルの説明
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA 2351

    KLA

    2351

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前
    KLA 2351

    KLA

    2351

    Defect Inspectionヴィンテージ: 0状態: 中古最終検証:60日以上前