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KLA 2367
    説明
    Brightfield inspection
    構成
    KLA-Tencor,  2367, Bright Field Patterned Inspection, 300mm            Missing PartsOEM Part NumberOEM DescriptionQTYStatus0076508-000TESTED,SDB1600MPX,V2 (Sensor Daughter Board)16Totally missing0279583-000FRU ASSY,AMPLIFER,STAGE,Z1Totally missing0093388-001TESTED,PSB3200MPX,BRD_B (DC to DC Board)1Totally missing730-774350-001CABLE,MAC-D TO X FLEX SIGNAL1Totally missing0086079-002TESTED,INPUT DATA ADAPTOR (IDA PCB)  (Inside: 0101705-000)5Totally missing0031224-003ASSY,FILTER WHEEL,236X1Totally missing730-733835-001CABEL, MAC to MAC-D PWR1Totally missing730-772676-002CABEL, PNEUMATIC SOLENOID PIGTAIL1Totally missing0095782-000ASSY,FIBER OPTIC NODE #0 to #41Totally missing0095784-000ASSY,FIBER OPTIC NODE #2 to #61Totally missing0095785-000ASSY,FIBER OPTIC NODE #3 to #71Totally missing0095787-000ASSY,FIBER OPTIC NODE #4 to #81Totally missing0095789-000ASSY,FIBER OPTIC NODE #5 to #91Totally missing0095791-000ASSY,FIBER OPTIC NODE #6 to #101Totally missing0095792-000ASSY,FIBER OPTIC NODE #7 to #111Totally missing0103943-000ASSY, F.O, TDC 0 OUT, CRTA TO NODE #0-11Totally missing0103944-000ASSY, F.O, TDC 1 OUT, CRTA TO NODE #2-31Totally missing0103945-000Assy, SGB Out to RTAP1Totally missing0095216-000Net gear 24port net switch plus mounting bracket in UI box1Totally missing0115395-000Upper, Monitor (VDU) in UI 1Totally missing0119930-000G5 X-SERVER RTAP (Apple Image system) 1Totally missing0101705-000ASSY, TESTED, G5 X-SERVER NODE4Totally missing0276654-000FRU ASSY,TESTED POWER SUPPLY, M31 HOST/N2Totally missingPN UnknownTrackball mouse on UI unit (OEM PN unknown, cost about $900)1Totally missing0083821-000line conditioner (Mains Transformer)1Totally missing0298771-000Image Computer (Apple) Hard Disc3Dead / not recoverable0066560-000SCC DELL Computer Hard Disc6Dead / not recoverable
    OEMモデルの説明
    The 2367 UV/visible brightfield inspector is sensitive to a broad range of defects for 65nm and above design nodes. It has improved throughput, high defect sampling, and is field-upgradeable from any 23xx systems. It has a 2x data rate increase, low false count rate, and automatic defect classification algorithms. It can be used with 28xx inspection systems and other KLA-Tencor tools. It also has a Process Window Qualification application for detecting systematic defects.
    ドキュメント

    ドキュメントなし

    KLA

    2367

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    17628


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明

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    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
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    同様のリスト
    すべて表示
    KLA 2367
    KLA2367Defect Inspection
    ヴィンテージ: 2007状態: 中古
    最終確認29日前

    KLA

    2367

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    listing-photo-IQ2SKuTaXgICfTVUQ_mgIuvB9LnM2WTIp7DG8_KNIsk-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/g9NikV1Q4QqDXKPmuHM19I5gst7W6IUGmWUQfxQR2vk/IQ2SKuTaXgICfTVUQ_mgIuvB9LnM2WTIp7DG8_KNIsk/CBOrc7C5HBsSRWE7C7xlTYw7TlFrnXH-4PEy5ZLjBlU_20190315_083134_f
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    17628


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Brightfield inspection
    構成
    KLA-Tencor,  2367, Bright Field Patterned Inspection, 300mm            Missing PartsOEM Part NumberOEM DescriptionQTYStatus0076508-000TESTED,SDB1600MPX,V2 (Sensor Daughter Board)16Totally missing0279583-000FRU ASSY,AMPLIFER,STAGE,Z1Totally missing0093388-001TESTED,PSB3200MPX,BRD_B (DC to DC Board)1Totally missing730-774350-001CABLE,MAC-D TO X FLEX SIGNAL1Totally missing0086079-002TESTED,INPUT DATA ADAPTOR (IDA PCB)  (Inside: 0101705-000)5Totally missing0031224-003ASSY,FILTER WHEEL,236X1Totally missing730-733835-001CABEL, MAC to MAC-D PWR1Totally missing730-772676-002CABEL, PNEUMATIC SOLENOID PIGTAIL1Totally missing0095782-000ASSY,FIBER OPTIC NODE #0 to #41Totally missing0095784-000ASSY,FIBER OPTIC NODE #2 to #61Totally missing0095785-000ASSY,FIBER OPTIC NODE #3 to #71Totally missing0095787-000ASSY,FIBER OPTIC NODE #4 to #81Totally missing0095789-000ASSY,FIBER OPTIC NODE #5 to #91Totally missing0095791-000ASSY,FIBER OPTIC NODE #6 to #101Totally missing0095792-000ASSY,FIBER OPTIC NODE #7 to #111Totally missing0103943-000ASSY, F.O, TDC 0 OUT, CRTA TO NODE #0-11Totally missing0103944-000ASSY, F.O, TDC 1 OUT, CRTA TO NODE #2-31Totally missing0103945-000Assy, SGB Out to RTAP1Totally missing0095216-000Net gear 24port net switch plus mounting bracket in UI box1Totally missing0115395-000Upper, Monitor (VDU) in UI 1Totally missing0119930-000G5 X-SERVER RTAP (Apple Image system) 1Totally missing0101705-000ASSY, TESTED, G5 X-SERVER NODE4Totally missing0276654-000FRU ASSY,TESTED POWER SUPPLY, M31 HOST/N2Totally missingPN UnknownTrackball mouse on UI unit (OEM PN unknown, cost about $900)1Totally missing0083821-000line conditioner (Mains Transformer)1Totally missing0298771-000Image Computer (Apple) Hard Disc3Dead / not recoverable0066560-000SCC DELL Computer Hard Disc6Dead / not recoverable
    OEMモデルの説明
    The 2367 UV/visible brightfield inspector is sensitive to a broad range of defects for 65nm and above design nodes. It has improved throughput, high defect sampling, and is field-upgradeable from any 23xx systems. It has a 2x data rate increase, low false count rate, and automatic defect classification algorithms. It can be used with 28xx inspection systems and other KLA-Tencor tools. It also has a Process Window Qualification application for detecting systematic defects.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA 2367
    KLA
    2367
    Defect Inspectionヴィンテージ: 2007状態: 中古最終検証: 29日前
    KLA 2367
    KLA
    2367
    Defect Inspectionヴィンテージ: 0状態: 中古最終検証: 30日以上前
    KLA 2367
    KLA
    2367
    Defect Inspectionヴィンテージ: 0状態: 改修済み最終検証: 60日以上前