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KLA 2800
    説明
    KLA2800 Lamp
    構成
    構成なし
    OEMモデルの説明
    The 2800 Series is a next-generation broadband DUV/UV/VIS patterned wafer inspection platform for sub-65-nm design rule development and production. It delivers maximum sensitivity, 2X better throughput than previous-generation DUV tools, and has a roadmap that extends to 45-nm and beyond design rules. It offers an array of optical modes and accelerates time to results with advanced binning and realtime defect classification. The 2800 Series is suited for unique applications such as Photo Cell Monitoring, Process Window Qualification, and Micro After-Develop Inspection. It complements the Puma 9000 Series darkfield platform and eS3x electron-beam inspection system to enable a comprehensive defect inspection strategy.
    ドキュメント

    ドキュメントなし

    KLA

    2800

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 30日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    101300


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明

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    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA 2800
    KLA2800Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認30日以上前

    KLA

    2800

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 30日以上前
    listing-photo-7b4aeb4b4ac040f7a5eb3f9fc9d59386-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    101300


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    KLA2800 Lamp
    構成
    構成なし
    OEMモデルの説明
    The 2800 Series is a next-generation broadband DUV/UV/VIS patterned wafer inspection platform for sub-65-nm design rule development and production. It delivers maximum sensitivity, 2X better throughput than previous-generation DUV tools, and has a roadmap that extends to 45-nm and beyond design rules. It offers an array of optical modes and accelerates time to results with advanced binning and realtime defect classification. The 2800 Series is suited for unique applications such as Photo Cell Monitoring, Process Window Qualification, and Micro After-Develop Inspection. It complements the Puma 9000 Series darkfield platform and eS3x electron-beam inspection system to enable a comprehensive defect inspection strategy.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA 2800
    KLA
    2800
    Defect Inspectionヴィンテージ: 0状態: 中古最終検証: 30日以上前