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説明
KLA2810 lamp構成
構成なしOEMモデルの説明
For broadband optical defect inspection. In June 2007 KLA introduced the newest additions to our 28xx product series, the 2810 and 2815. Targeting the 45nm node, these are the first inspection systems designed specifically for memory or logic applications. The 2810 and 2815 have twice the computing speed of the 2800 and new optical modes that enable increased defect capture.ドキュメント
ドキュメントなし
KLA
2810
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
101316
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
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説明
KLA2810 lamp構成
構成なしOEMモデルの説明
For broadband optical defect inspection. In June 2007 KLA introduced the newest additions to our 28xx product series, the 2810 and 2815. Targeting the 45nm node, these are the first inspection systems designed specifically for memory or logic applications. The 2810 and 2815 have twice the computing speed of the 2800 and new optical modes that enable increased defect capture.ドキュメント
ドキュメントなし