説明
Metrology (Defect Inspection)構成
Laser; bright field and dark fieldOEMモデルの説明
The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Defect Inspection
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142342
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
CANDELA 8720
カテゴリ
Defect Inspection
最終検証： 13日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
142342
ウェーハサイズ：
8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Metrology (Defect Inspection)構成
Laser; bright field and dark fieldOEMモデルの説明
The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.ドキュメント
ドキュメントなし