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KLA CANDELA CS900
    説明
    Surface Analyzer
    構成
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEMモデルの説明
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    ドキュメント
    ファイルアイコン

    Candela CS 900.mov

    KLA

    CANDELA CS900

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証： 30日以上前

    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    90138

    ウェーハサイズ：

    4"/100mm, 5"/125mm, 6"/150mm

    ヴィンテージ：

    2017

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspection
    ヴィンテージ： 2017状態： 中古
    最終確認30日以上前

    KLA

    CANDELA CS900

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証： 30日以上前
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/d4da584ce58747398cacc75ee9648596_7037c292588b43ce999c7f57e490fa8d_mw.jpeg
    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/20c26e0395794c888341511130170e18_d3d89809c40d424084775ee28123dc00_mw.jpeg
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    listing-photo-54ee853babee4b96a18ea548c92be66e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/54ee853babee4b96a18ea548c92be66e/caba603570ad48bd82823f70b85380f9_0f1303f9f2cb47eda536d9475fa03ddd1201a_mw.jpeg
    主なアイテムの詳細
    状態：

    Used

    稼働ステータス:

    不明

    製品ID：

    90138

    ウェーハサイズ：

    4"/100mm, 5"/125mm, 6"/150mm

    ヴィンテージ：

    2017

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Surface Analyzer
    構成
    - Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes
    OEMモデルの説明
    KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.
    ドキュメント
    ファイルアイコン

    Candela CS 900.mov

    同様のリスト
    すべて表示
    KLA CANDELA CS900

    KLA

    CANDELA CS900

    Defect Inspectionヴィンテージ： 2017状態： 中古最終検証： 30日以上前