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CANDELA CS920
概要（Overview）
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.
現在の掲載品
3
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検査、保証、鑑定、ロジスティクス
