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説明
説明なし構成
構成なしOEMモデルの説明
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
112452
ウェーハサイズ：
不明
ヴィンテージ：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS920
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Installed / Running
製品ID：
112452
ウェーハサイズ：
不明
ヴィンテージ：
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし構成
構成なしOEMモデルの説明
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.ドキュメント
ドキュメントなし