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KLA PUMA 9130
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Puma 9130 is a Laser Imaging Patterned Wafer Inspection System that combines UV illumination optics with multiple high-speed imaging sensors to offer a range of optical modes for critical defect detection inline on patterned, production wafers1. It delivers high sampling rates, high throughput, and high sensitivity enabling more effective capture and control of yield-impacting defects on critical front-end-of-line (FEOL) and back-end-of-line (BEOL) layers1. The Puma 9130 provides oblique UV illumination while the 9150 also offers an additional, normal illumination mode. Both tools provide three illumination polarizations (S, P, C) and independently configured collection polarization filters (S, P, None) for each of the three channels.
    ドキュメント

    ドキュメントなし

    KLA

    PUMA 9130

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    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    65430


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明

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    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA PUMA 9130
    KLAPUMA 9130Defect Inspection
    ヴィンテージ: 0状態: 中古
    最終確認60日以上前

    KLA

    PUMA 9130

    verified-listing-icon

    検証済み

    カテゴリ

    Defect Inspection
    最終検証: 60日以上前
    listing-photo-5ee36698621748b69b4e477a5df352ac-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    65430


    ウェーハサイズ:

    不明


    ヴィンテージ:

    不明


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    説明なし
    構成
    構成なし
    OEMモデルの説明
    The Puma 9130 is a Laser Imaging Patterned Wafer Inspection System that combines UV illumination optics with multiple high-speed imaging sensors to offer a range of optical modes for critical defect detection inline on patterned, production wafers1. It delivers high sampling rates, high throughput, and high sensitivity enabling more effective capture and control of yield-impacting defects on critical front-end-of-line (FEOL) and back-end-of-line (BEOL) layers1. The Puma 9130 provides oblique UV illumination while the 9150 also offers an additional, normal illumination mode. Both tools provide three illumination polarizations (S, P, C) and independently configured collection polarization filters (S, P, None) for each of the three channels.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA PUMA 9130
    KLA
    PUMA 9130
    Defect Inspectionヴィンテージ: 0状態: 中古最終検証: 60日以上前