説明
Wafer Inspection System Details Attached構成
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEMモデルの説明
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Defect Inspection
最終検証： 10日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
148640
ウェーハサイズ：
4"/100mm, 6"/150mm, 8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
SURFSCAN 6100
カテゴリ
Defect Inspection
最終検証： 10日前
主なアイテムの詳細
状態：
Used
稼働ステータス:
Deinstalled
製品ID：
148640
ウェーハサイズ：
4"/100mm, 6"/150mm, 8"/200mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Wafer Inspection System Details Attached構成
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEMモデルの説明
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.ドキュメント
ドキュメントなし