説明
Wafer Inspection System構成
- Software version: NGS 5.4 SR03 HF03 - Power rating: 208V3W-N - Loading configuration: 3 - Possible damage to chuck area due to a wafer breakage event - HDD removedOEMモデルの説明
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.ドキュメント
ドキュメントなし
KLA
SURFSCAN SP2
検証済み
カテゴリ
Defect Inspection
最終検証: 30日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
100909
ウェーハサイズ:
12"/300mm
ヴィンテージ:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示KLA
SURFSCAN SP2
カテゴリ
Defect Inspection
最終検証: 30日以上前
主なアイテムの詳細
状態:
Used
稼働ステータス:
不明
製品ID:
100909
ウェーハサイズ:
12"/300mm
ヴィンテージ:
2010
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Wafer Inspection System構成
- Software version: NGS 5.4 SR03 HF03 - Power rating: 208V3W-N - Loading configuration: 3 - Possible damage to chuck area due to a wafer breakage event - HDD removedOEMモデルの説明
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.ドキュメント
ドキュメントなし