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KLA SURFSCAN SP2
    説明
    working condition, but no HDD
    構成
    構成なし
    OEMモデルの説明
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
    ドキュメント

    KLA

    SURFSCAN SP2

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    84587


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2006

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspection
    ヴィンテージ: 2010状態: 中古
    最終確認30日以上前

    KLA

    SURFSCAN SP2

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 60日以上前
    listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/08a7ced9fabe4b808fbbdac163392d04_33d2f293e7d242b98632efe5db2247521201a_mw.jpeg
    listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/62642a34a92240a1ba533071d9749eb9_941ccf33b25644c2a075368e69c4bb64_mw.jpeg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    84587


    ウェーハサイズ:

    12"/300mm


    ヴィンテージ:

    2006


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    working condition, but no HDD
    構成
    構成なし
    OEMモデルの説明
    The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
    ドキュメント
    同様のリスト
    すべて表示
    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspectionヴィンテージ: 2010状態: 中古最終検証: 30日以上前
    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspectionヴィンテージ: 2005状態: 中古最終検証: 30日以上前
    KLA SURFSCAN SP2

    KLA

    SURFSCAN SP2

    Defect Inspectionヴィンテージ: 2006状態: 中古最終検証: 60日以上前