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KLA SURFSCAN SP3
    説明
    HD not included Good working condition Wafer Inspection System
    構成
    構成なし
    OEMモデルの説明
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    ドキュメント

    ドキュメントなし

    KLA

    SURFSCAN SP3

    verified-listing-icon

    検証済み

    カテゴリ
    Defect Inspection

    最終検証: 29日前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    105386


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection
    ヴィンテージ: 2017状態: 中古
    最終確認29日前

    KLA

    SURFSCAN SP3

    verified-listing-icon
    検証済み
    カテゴリ
    Defect Inspection
    最終検証: 29日前
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/cdae5ed88a0f4aacabfc5e46cc924226_5_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/de11d5485f324c2e9f75537f1a547f84_3_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/6fe591cd23fb481d8a73a832cd193501_1_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/bb3f45609c314d11801e1e8cadcc4adb_2_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/20382d6aa95e45e5b5cc296750f1e94b_4_mw.jpg
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    105386


    ウェーハサイズ:

    不明


    ヴィンテージ:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    HD not included Good working condition Wafer Inspection System
    構成
    構成なし
    OEMモデルの説明
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspectionヴィンテージ: 2017状態: 中古最終検証:29日前
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspectionヴィンテージ: 0状態: 改修済み最終検証:60日以上前