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6" Fab For Sale from Moov - Click Here to Learn More

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6" Fab For Sale from Moov - Click Here to Learn More

KLA CANDELA CS1

説明

No missing parts.

構成

構成なし

OEMモデルの説明

The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.

ドキュメント

ドキュメントなし

KLA

CANDELA CS1

verified-listing-icon

検証済み

カテゴリ

Defect Inspection

最終検証： 60日以上前

主なアイテムの詳細

状態：

Used

稼働ステータス:

不明

製品ID：

47112

ウェーハサイズ：

不明

ヴィンテージ：

2007

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

同様のリスト

すべて表示

KLA CANDELA CS1

KLA

CANDELA CS1

Defect Inspection

ヴィンテージ： 2007状態：中古

最終確認60日以上前

KLA

CANDELA CS1

verified-listing-icon

検証済み

カテゴリ

Defect Inspection

最終検証： 60日以上前

listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/c354f3ddbe164866b26dd1c340c29361_913b85810e0e44669381c054e7a872931105c_mw.jpeg

listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/582d3e25e01f4da480322a76b22300e0_b930d6a8603d423b94a2699cce5273bc1201a_mw.jpeg

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listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/31e0b441f72e40d59cd25725c0bae72a_99a0d6e1c0e04902aa7a738d37c640581105c_mw.jpeg

listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/80bb7dff47244bef82d6c5a5646115e7_0e1585aaf4f64ddd889092b9360c7f801105c_mw.jpeg

listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/39d779b945fd40abaa16769e8f969bbd_a655698ffaea4c3aa88b203512e2f1861105c_mw.jpeg

listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/cf2e72f51bfe43b79cb148822390c49f_4f6ddaba8d114c9c91acbf1432c8d1bf1105c_mw.jpeg

主なアイテムの詳細

状態：

Used

稼働ステータス:

不明

製品ID：

47112

ウェーハサイズ：

不明

ヴィンテージ：

2007

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

説明

No missing parts.

構成

構成なし

OEMモデルの説明

The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.

ドキュメント

ドキュメントなし

同様のリスト

すべて表示

KLA CANDELA CS1

KLA

CANDELA CS1

Defect Inspectionヴィンテージ： 2007状態：中古最終検証：60日以上前