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6" Fab For Sale from Moov - Click Here to Learn More
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KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
説明
No missing parts.
構成
構成なし
OEMモデルの説明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
ドキュメント

ドキュメントなし

KLA

CANDELA CS1

verified-listing-icon

検証済み

カテゴリ
Defect Inspection

最終検証: 60日以上前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

47112


ウェーハサイズ:

不明


ヴィンテージ:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

CANDELA CS1

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 60日以上前
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/c354f3ddbe164866b26dd1c340c29361_913b85810e0e44669381c054e7a872931105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/582d3e25e01f4da480322a76b22300e0_b930d6a8603d423b94a2699cce5273bc1201a_mw.jpeg
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listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/31e0b441f72e40d59cd25725c0bae72a_99a0d6e1c0e04902aa7a738d37c640581105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/80bb7dff47244bef82d6c5a5646115e7_0e1585aaf4f64ddd889092b9360c7f801105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/39d779b945fd40abaa16769e8f969bbd_a655698ffaea4c3aa88b203512e2f1861105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/cf2e72f51bfe43b79cb148822390c49f_4f6ddaba8d114c9c91acbf1432c8d1bf1105c_mw.jpeg
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

47112


ウェーハサイズ:

不明


ヴィンテージ:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
No missing parts.
構成
構成なし
OEMモデルの説明
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
ドキュメント

ドキュメントなし