説明
Complete and in working condition. It is still connected to facilities to maintain vacuum, but is not being used currently.構成
Standard configuration. 300mm, two FOUP.OEMモデルの説明
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.ドキュメント
ドキュメントなし
KLA
eDR-7380
カテゴリ
Defect Inspection
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
131743
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Complete and in working condition. It is still connected to facilities to maintain vacuum, but is not being used currently.構成
Standard configuration. 300mm, two FOUP.OEMモデルの説明
The eDR7380 high performance electron-beam (e-beam) wafer defect review and classification system produces a comprehensive defect pareto in one test for accurate defect sourcing and faster excursion detection during production. Unique synergy with our inspectors facilitates accurate identification and classification of patterned wafer, bare wafer and bevel edge defects for faster yield learning during IC and wafer manufacturing.ドキュメント
ドキュメントなし