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ONTO / RUDOLPH / AUGUST F30
  • ONTO / RUDOLPH / AUGUST F30
  • ONTO / RUDOLPH / AUGUST F30
  • ONTO / RUDOLPH / AUGUST F30
  • ONTO / RUDOLPH / AUGUST F30
  • ONTO / RUDOLPH / AUGUST F30
説明
説明なし
構成
-Platform is specified for ISO5 -Filter wheel with color selection (RGB) -1x, 3x, 5x, 10x , 20x review -Has a OCR reader -Dark field function implemented -It can use the Discovery/True ADC software for offline review -CD measurements are possible, but there is no separate optic available for this -Bare wafers only. Must be modified if sawn wafers are on frame.
OEMモデルの説明
The F30™ System is an advanced inspection tool designed to blur the lines between dark field micro inspection and traditional macro inspection. It provides automated defect inspection for front-end and outgoing quality (OQA) applications. The system boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite, the F30 System redefines inspection cost of ownership expectations. It has a throughput of up to 120 wph (10µm) and resolution flexibility (10µm to 0.5µm). It also has three simultaneous color defect review methods: on-the-fly, high resolution, whole wafer. The F30 System is suitable for a variety of applications including After develop inspection (ADI), Fab Outgoing QA, Post CMP inspection, and After etch inspection. It can also team with edge and backside modules for an all-surface solution.
ドキュメント

ドキュメントなし

EXCLUSIVE
remarketing-logo-inventory
Inventory
カテゴリ
Defect Inspection

最終検証: 26日前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

77528


ウェーハサイズ:

6"/150mm, 8"/200mm


ヴィンテージ:

2015


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
EXCLUSIVE
remarketing-logo-inventory
Inventory

ONTO / RUDOLPH / AUGUST

F30

verified-listing-icon
検証済み
カテゴリ
Defect Inspection
最終検証: 26日前
listing-photo-41c7893d50b24789bf636410ee7212d6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51602/41c7893d50b24789bf636410ee7212d6/b35ddf5bd6614b4191c4e3d3cc0f497e_e04c6e62ded64d5eb4c798acf9bc36fa829f9b319eda4263b767097e442e81871105cf_mw.jpeg
listing-photo-41c7893d50b24789bf636410ee7212d6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51602/41c7893d50b24789bf636410ee7212d6/ae5eb03623fb4adc9073c2219271d39e_d8b991cdaac341d3afc12d8b4c82bd0516d64c8942444cacb4ad1724e6a767d31105cf_mw.jpeg
listing-photo-41c7893d50b24789bf636410ee7212d6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51602/41c7893d50b24789bf636410ee7212d6/daff30290d844f3ca53d9b3da4e9a978_da0250ca765748a3a0cec099963f16e28896d6283bf546518be0d69cf881f4121105cf_mw.jpeg
listing-photo-41c7893d50b24789bf636410ee7212d6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51602/41c7893d50b24789bf636410ee7212d6/e481272731c5446c850d8a4673a08d25_da76bf6bcf0e42d5b8472f25fef8d02cd8b295e56e394099b183b0baf10fac9d1105cf_mw.jpeg
listing-photo-41c7893d50b24789bf636410ee7212d6-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/51602/41c7893d50b24789bf636410ee7212d6/b758a16dda9842868b61fa2824d996d8_8497b84e15e5404491142b926f46c6edd31d8f66b6a843ddab54f177d12bfaac1201af_mw.jpeg
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

77528


ウェーハサイズ:

6"/150mm, 8"/200mm


ヴィンテージ:

2015


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし
構成
-Platform is specified for ISO5 -Filter wheel with color selection (RGB) -1x, 3x, 5x, 10x , 20x review -Has a OCR reader -Dark field function implemented -It can use the Discovery/True ADC software for offline review -CD measurements are possible, but there is no separate optic available for this -Bare wafers only. Must be modified if sawn wafers are on frame.
OEMモデルの説明
The F30™ System is an advanced inspection tool designed to blur the lines between dark field micro inspection and traditional macro inspection. It provides automated defect inspection for front-end and outgoing quality (OQA) applications. The system boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite, the F30 System redefines inspection cost of ownership expectations. It has a throughput of up to 120 wph (10µm) and resolution flexibility (10µm to 0.5µm). It also has three simultaneous color defect review methods: on-the-fly, high resolution, whole wafer. The F30 System is suitable for a variety of applications including After develop inspection (ADI), Fab Outgoing QA, Post CMP inspection, and After etch inspection. It can also team with edge and backside modules for an all-surface solution.
ドキュメント

ドキュメントなし