説明
KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool · Dual 300 mm Loadports · Analysis of 190nm-800nm Wavelengths · White Light Reflectometer · Broadband Spectroscopic Ellipsometer · Single Wave Ellipsometer · Stress Measurement · iDesorber構成
構成なしOEMモデルの説明
The Aleris 8350 is a high-performance film metrology system that meets the tighter process tolerances required for thickness, refractive index and stress measurements on critical films. The Aleris 8350 film thickness measurement system is used for advanced film development, characterization and process control for a wide range of critical films, including ultra-thin diffusion layers, ultra-thin gate oxides, advanced photoresists, 193nm ARC layers, ultra-thin multi-layer stacks, and CVD layers.ドキュメント
ドキュメントなし
検証済み
カテゴリ
Elipsometry
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
132907
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
同様のリスト
すべて表示
KLA
ALERIS 8350
カテゴリ
Elipsometry
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
132907
ウェーハサイズ：
12"/300mm
ヴィンテージ：
不明
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool · Dual 300 mm Loadports · Analysis of 190nm-800nm Wavelengths · White Light Reflectometer · Broadband Spectroscopic Ellipsometer · Single Wave Ellipsometer · Stress Measurement · iDesorber構成
構成なしOEMモデルの説明
The Aleris 8350 is a high-performance film metrology system that meets the tighter process tolerances required for thickness, refractive index and stress measurements on critical films. The Aleris 8350 film thickness measurement system is used for advanced film development, characterization and process control for a wide range of critical films, including ultra-thin diffusion layers, ultra-thin gate oxides, advanced photoresists, 193nm ARC layers, ultra-thin multi-layer stacks, and CVD layers.ドキュメント
ドキュメントなし