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KLA ALERIS 8350
    説明
    Thickness meter No missing parts Current Wafer size : 12
    構成
    構成なし
    OEMモデルの説明
    The Aleris 8350 is a high-performance film metrology system that meets the tighter process tolerances required for thickness, refractive index and stress measurements on critical films. The Aleris 8350 film thickness measurement system is used for advanced film development, characterization and process control for a wide range of critical films, including ultra-thin diffusion layers, ultra-thin gate oxides, advanced photoresists, 193nm ARC layers, ultra-thin multi-layer stacks, and CVD layers.
    ドキュメント

    ドキュメントなし

    KLA

    ALERIS 8350

    verified-listing-icon

    検証済み

    カテゴリ
    Elipsometry

    最終検証: 60日以上前

    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    107075


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    同様のリスト
    すべて表示
    KLA ALERIS 8350

    KLA

    ALERIS 8350

    Elipsometry
    ヴィンテージ: 0状態: 中古
    最終確認15日前

    KLA

    ALERIS 8350

    verified-listing-icon
    検証済み
    カテゴリ
    Elipsometry
    最終検証: 60日以上前
    listing-photo-8d500a810f714093bc6de6b0cc6d5a3e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    主なアイテムの詳細

    状態:

    Used


    稼働ステータス:

    不明


    製品ID:

    107075


    ウェーハサイズ:

    8"/200mm, 12"/300mm


    ヴィンテージ:

    不明


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    説明
    Thickness meter No missing parts Current Wafer size : 12
    構成
    構成なし
    OEMモデルの説明
    The Aleris 8350 is a high-performance film metrology system that meets the tighter process tolerances required for thickness, refractive index and stress measurements on critical films. The Aleris 8350 film thickness measurement system is used for advanced film development, characterization and process control for a wide range of critical films, including ultra-thin diffusion layers, ultra-thin gate oxides, advanced photoresists, 193nm ARC layers, ultra-thin multi-layer stacks, and CVD layers.
    ドキュメント

    ドキュメントなし

    同様のリスト
    すべて表示
    KLA ALERIS 8350

    KLA

    ALERIS 8350

    Elipsometryヴィンテージ: 0状態: 中古最終検証:15日前
    KLA ALERIS 8350

    KLA

    ALERIS 8350

    Elipsometryヴィンテージ: 0状態: 中古最終検証:60日以上前
    KLA ALERIS 8350

    KLA

    ALERIS 8350

    Elipsometryヴィンテージ: 0状態: 中古最終検証:60日以上前