説明

説明なし

構成

SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1. 512DR+ 3201/0(QUARTER) 2. 1024DR+6401/0 HALF) 3. 2048DR+12801/0FULL [1-3] . . . . . >3 CONFIGURATION OF TEST HEAD PE BOARD 0. NOT EXIST 1.EXIST DR PIN 1A1 1A5 17A1 25A1 CHILD A,B . . . . > 1 1 1 1 CHILD C,D . . . . > 1 1 1 1 CHILD E,F . . . . .> 1 1 1 1 CHILD G,H . . . . > 1 1 1 1 IO PIN 33A1 97A1 33A5 97A5 CHILD A,B . . . . > 1 1 1 1 CHILD C,D . . . . > 1 1 1 1 CHILD E,F . . . . .> 1 1 1 1 CHILD G,H . . . . > 1 1 1 1 CONFIGURATION OF DPU DC CONFIGURATION [1-128] . . . . . . . . . . >1-128 PPS CONFIGURATION [1-256] ] . . . . . . . . . . >1-256 AC FREQUENCY (Hz) [50,60] . . . . . . . . . . . . . . . . . . . . . . . . .> 60 CONFIGURATION OF FTU FLASH OPTION [Y, N] . . . . . . . . . . . . . . . . . . . . . . . . . . [YES] CONFIGURATION OF FM NUMBER OF FMRA BOARD [0, 8] . . . . . . . . . . . . . . . . . . . . . . . .> 8 SIZE OF FMRA BOARD [1:8G, 2:16G] . . . . . . . . . . . . . . . . . .>2 PM (PATTERN MEMORY) BOARD EXIST [Y, N] . . . . . . . . . . . . . . . .> NO CONFIGURATION OF MRA MRA4 EXIST [Y,N] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . > YES RCPU STN1 A-D EXIST [Y,N] . . . . . . . . . . . . . . . . . . . . . . > YES RCPU STN1 E-H EXIST [Y,N] . . . . . . . . . . . . . . . . . . . . . . .> YES

OEMモデルの説明

The ADVANTEST T5377S is a versatile memory test system capable of efficiently and cost-effectively testing a wide range of memory types. This system can handle both traditional and high-speed memory interfaces, making it suitable for various memory testing requirements. With its advanced features and capabilities, the T5377S ensures reliable and accurate testing, optimizing the testing process for memory devices while keeping costs under control.