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ADVANTEST T5833
  • ADVANTEST T5833
  • ADVANTEST T5833
  • ADVANTEST T5833
説明
説明なし
構成
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLE
OEMモデルの説明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
ドキュメント

ドキュメントなし

verified-listing-icon

検証済み

カテゴリ
Final Test

最終検証: 60日以上前

主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

102899


ウェーハサイズ:

不明


ヴィンテージ:

2019


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ADVANTEST

T5833

verified-listing-icon
検証済み
カテゴリ
Final Test
最終検証: 60日以上前
listing-photo-060f832e41cb49d9bdd93985dc453cb2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
主なアイテムの詳細

状態:

Used


稼働ステータス:

不明


製品ID:

102899


ウェーハサイズ:

不明


ヴィンテージ:

2019


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
説明なし
構成
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLE
OEMモデルの説明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
ドキュメント

ドキュメントなし