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説明
説明なし構成
Two of the cooling systems and two of the oven units that has 2 ovens each.OEMモデルの説明
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.ドキュメント
ドキュメントなし
ADVANTEST
B6700D
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
New
稼働ステータス:
不明
製品ID：
96442
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
説明なし構成
Two of the cooling systems and two of the oven units that has 2 ovens each.OEMモデルの説明
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.ドキュメント
ドキュメントなし