説明
Memory Burn-in Tester B6700L構成
B6700L#2OEMモデルの説明
B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.ドキュメント
ドキュメントなし
ADVANTEST
B6700L
検証済み
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
102452
ウェーハサイズ：
不明
ヴィンテージ：
不明
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
B6700L
カテゴリ
Final Test
最終検証： 30日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
102452
ウェーハサイズ：
不明
ヴィンテージ：
不明
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
説明
Memory Burn-in Tester B6700L構成
B6700L#2OEMモデルの説明
B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.ドキュメント
ドキュメントなし