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説明
説明なし構成
構成なしOEMモデルの説明
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.ドキュメント
ドキュメントなし
ADVANTEST
T2000 AiR
カテゴリ
Final Test
最終検証： 60日以上前
主なアイテムの詳細
状態：
Used
稼働ステータス:
不明
製品ID：
112652
ウェーハサイズ：
不明
ヴィンテージ：
不明
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説明
説明なし構成
構成なしOEMモデルの説明
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.ドキュメント
ドキュメントなし